Automatic functional testing services for integrated circuits under JEDEC standards.
GS Nanotech offers services for Automatic functional and structural testing for integrated circuits.
We offer our expertise in testing circuits:
Equipment: Teradyne UltraFlex
| Test data rate | 200 MHz |
| Vector memory depth | 32 М |
| Digital I/O, channel | 768 |
| Analog: - source, channel - capture, channel |
8 8 |
| DPS, channel | 80 |
| Parallel testing | up to 9 DUTs |
| Temperature range | -60 / +160 |
The finished products can be subject to laser marking, packed in a blister strip or trays and transported to customers.
INVESTMENT AND INDUSTRY HOLDING, OPERATING USING ITS OWN HIGH TECHNOLOGY IN TELECOMMUNICATIONS AND INNOVATION
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